NJU6495 Series
Quad Pin Electronics Driver

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  • Description

    The NJU6495 is a quad pin driver fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn In (TDBI) applications, flash memory testers, where cost, functional density, and power are all at a premium.The NJU6495 incorporates four channels of programmable drivers into a small 64 lead LQFP package. Each channel has independent driver levels, data, and high impedance control.This device has a 15V output range, can operate 50MHz signal and features very low leakage in HiZ mode. Those features enable to interface directly with TTL, ECL, CMOS(3V, 5V and 7V), LVCMOS, and custom level circuitry, as well as high voltage levels required for many special test modes in Flash Devices and for stressing devices under test.

    Applications

    • Burn In ATE
    • Low Cost ATE
    • Instrumentation

  • Spec
    Consumer
    Supply Voltage 8V to 15V
    Structure CMOS Technology
    Wide Operating Temperature -20℃ to +75℃
    Junction Temp. +150℃
    Package LQFP64-H2
    Low Leak Current Max.2nA When Ta=25°C
    DC Output Current Max.125mA
    Note Max. 15V Output Range
    Max. 50MHz Operation
  • Technical
    Documents
  • Quality &
    Packages
    • Refer to the datasheets for the details on the product.
    • The package file or the datasheet includes package dimensions, taping specifications, taping reels dimensions, power dissipations, and recommended land pattern.

Download Datasheet

Functional Description

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