估计故障率 : FIT/MTTF(电子设备产品)

Estimated Failure Rate (FIT) / Mean Time To Failure (MTTF)

TYPE ESTIMATED
FAILURE
RATE
MEAN TIME
TO FAILURE
(MTTF)
CONFIDENCE LEVEL TOTAL NUMBER OF
TESTS × TIME
(COMPONENT HOUR)
NUMBER OF FAILURE
SAMPLES
TEST TEMPERATURE USE TEMPERATURE ACTIVATION ENERGY TEMPERATURE
ACCELERATION
FACTOR
CMOS IC 1Fit 1.00×10+9h 60% 1.70×10+7 0pcs 125°C 60°C 0.7eV 53.7 times
Bi-CMOS IC 1Fit 0.97×10+9h 60% 1.65×10+7 0pcs 125°C 60°C 0.7eV 53.7 times
Bipolar IC 1Fit 1.00×10+9h 60% 3.20×10+6 0pcs 125°C 60°C 1.0eV 296 times
GaAs IC 6Fit 1.67×10+8h 60% 5.30×10+5 0pcs 125°C 60°C 1.0eV 296 times
Opt Device 3Fit 3.33×10+8h 60% 7.20×10+5 0pcs 100°C 40°C 1.0eV 389 times