估计故障率（电子设备产品）
估计故障率（电子设备产品）
ESTIMATED FAILURE RATE/MEAN TIME TO FAILURE(MTTF)
| TYPE | ESTIMATED FAILURE RATE |
MEAN TIME TO FAILURE (MTTF) |
CONFIDENCE LEVEL |
TOTAL NUMBER OF TESTS X TIME (COMPONENT HOUR) |
NUMBER OF FAILURE SAMPLES |
TEST TEMPERATURE |
USE TEMPERATURE |
ACTIVATION ENERGY |
TEMPERATURE ACCELERATION FACTOR |
|---|---|---|---|---|---|---|---|---|---|
| CMOS IC | 1Fit | 1.00×10+9h | 60% | 1.70×10+7 | ０pcs | 125℃ | 60℃ | 0.7eV | 53.7 times |
| Bi-CMOS IC | 1Fit | 0.97×10+9h | 60% | 1.65×10+7 | ０pcs | 125℃ | 60℃ | 0.7eV | 53.7 times |
| Bipolar IC | 1Fit | 1.00×10+9h | 60% | 3.20×10+6 | ０pcs | 125℃ | 60℃ | 1.0eV | 296 times |
| GaAs IC | 6Fit | 1.67×10+8h | 60% | 5.30×10+5 | ０pcs | 125℃ | 60℃ | 1.0eV | 296 times |
| Opt Device | 3Fit | 3.33×10+8h | 60% | 7.20×10+5 | ０pcs | 100℃ | 40℃ | 1.0eV | 389 times |