估计故障率(电子设备产品)

ESTIMATED FAILURE RATE/MEAN TIME TO FAILURE(MTTF)

TYPE ESTIMATED
FAILURE
RATE
MEAN TIME
TO
FAILURE
(MTTF)
CONFIDENCE
LEVEL
TOTAL
NUMBER OF
TESTS X TIME
(COMPONENT HOUR)
NUMBER OF FAILURE
SAMPLES
TEST
TEMPERATURE
USE
TEMPERATURE
ACTIVATION
ENERGY
TEMPERATURE
ACCELERATION
FACTOR
CMOS IC 1Fit 1.00×10+9h 60% 1.70×10+7 0pcs 125℃ 60℃ 0.7eV 53.7
times
Bi-CMOS IC 1Fit 0.97×10+9h 60% 1.65×10+7 0pcs 125℃ 60℃ 0.7eV 53.7
times
Bipolar IC 1Fit 1.00×10+9h 60% 3.20×10+6 0pcs 125℃ 60℃ 1.0eV 296
times
GaAs IC 6Fit 1.67×10+8h 60% 5.30×10+5 0pcs 125℃ 60℃ 1.0eV 296
times
Opt Device 3Fit 3.33×10+8h 60% 7.20×10+5 0pcs 100℃ 40℃ 1.0eV 389
times