估计故障率 : FIT/MTTF（电子设备产品）

Estimated Failure Rate (FIT) / Mean Time To Failure (MTTF)

TYPE ESTIMATED
FAILURE
RATE		 MEAN TIME
TO FAILURE
(MTTF)		 CONFIDENCE
LEVEL		 TOTAL NUMBER OF
TESTS × TIME
(COMPONENT HOUR)		 NUMBER OF
FAILURE
SAMPLES		 TEST
TEMPERATURE		 USE
TEMPERATURE		 ACTIVATION
ENERGY		 TEMPERATURE
ACCELERATION
FACTOR
CMOS IC 1 FIT 1.00×109h 60% 1.70×107 0 pcs 125°C 60°C 0.7eV 53.7 times
Bi-CMOS IC 1 FIT 0.97×109h 60% 1.65×107 0 pcs 125°C 60°C 0.7eV 53.7 times
Bipolar IC 1 FIT 1.00×109h 60% 3.20×106 0 pcs 125°C 60°C 1.0eV 296 times
GaAs IC 6 FIT 1.67×108h 60% 5.30×105 0 pcs 125°C 60°C 1.0eV 296 times
Opt Device 3 FIT 3.33×108h 60% 7.20×105 0 pcs 100°C 40°C 1.0eV 389 times
  • R**** ; CMOS IC
  • NJU**** ; CMOS IC
  • NJW**** ; Bi-CMOS IC
  • NJM**** ; Bipolar IC
  • NJG**** ; GaAs IC
  • NJL**** ; Opt Device
  • Nx**** ; 请参阅数据表摘要